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The Annual Meeting of STK 2010 was held on
June 16th, 2010 at Sika in Sarnen and was mainly focused
on Polymer and Material Characterization using TA-Techniques.
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Scientific
Committee
Jean-Nicolas AEBISCHER, EIF, Fribourg
Rolf HILFIKER, Solvias AG, Basel
Siegfried KRIMMER, Roche, Basel
Gerhard LEU, Sika Technology AG, Zürich
Alois RAEMY, Nestlé SA Lausanne
Rudolf RIESEN, Mettler-Toledo, Schwerzenbach
Françis STOESSEL, Swiss Safety Institute, Basel
Benoît ZUFFEREY, Firmenich, La Plaine Genève
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Exhibition
Mettler Toledo
ChemiSens
TA Instruments
Setaram
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